Smarter Reliability Testing for Electronics:
Join Our Free Webinar on July 24
As electronic devices become more complex, the need for smarter, more predictive reliability testing is greater than ever. If you’re a reliability engineer, electronics manufacturer, or part of a process development team, don’t miss this opportunity to deepen your expertise.
On July 24, 2025, at 1:00 PM CT, Magnalytix and Foresite Inc. are hosting a free, one-hour live webinar on the future of electronic cleanliness and reliability testing.
Webinar Topic:
Comparing SIR IPC B-52 to Umpire 41 Functional & SIR Test Method
In this session, you’ll learn how the Umpire 41 method is redefining how we test for reliability. Unlike traditional methods, Umpire 41 simulates real-world environmental conditions like temperature, humidity, and electrical bias—providing deeper, more accurate insights into material performance and the impact of residues.
Meet the Speakers
Mike Bixenman, President, Magnalytix
An industry leader in contamination testing and IPC standards.
Terry Munson, President, Foresite Inc.
A renowned expert and the inventor of the patented C3 system.
Why Attend?
If you want to stay ahead of evolving reliability challenges in electronics manufacturing, this session will give you the tools and knowledge to improve your testing methods—and your outcomes. Join us to ensure cleanliness and safety stay at the forefront of your work.
👉 Reserve your spot now: